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SRAM FPGA Reliability Analysis for Harsh Radiation Environments

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TNS09_B3.pdf
Year
2009
Authors
P. Ostler, M. Caffrey, D. Gibelyou, P. Graham, K. Morgan, B. Pratt, H. Quinn, and M. Wirthlin
Additional Citation Information
IEEE Transactions on Nuclear Science (TNS), Vol. 56, No. 6, Dec. 2009, pp. 3519-3526