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Single-Event Characterization of the 28 nm Xilinx Kintex-7 Field-Programmable Gate Array under Heavy Ion Irradiation

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07004595.pdf
Year
2014
Authors
David Lee, Michael Wirthlin, Gary Swift, Anthony Le
Additional Citation Information
Radiation Effects Data Workshop (REDW), 2014 IEEE , vol., no., pp.1,5, 14-18 July 2014, doi: 10.1109/REDW.2014.7004595