Statistical Method to Extract Radiation-Induced Multiple-Cell Upsets in SRAM-Based FPGAs | SHREC: NSF Center for Space, High-Performance & Resilient Computing

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Year

2020

Authors

A. Perez-Celis, M. Wirthlin

Conference/Journal Information

IEEE Transactions on Nuclear Science, Volume 67, Issue: 1

Date

Nov. 21, 2019

DOI/Conference Number

10.1109/TNS.2019.2955006