Emulating Radiation-Induced Multicell Upset Patterns in SRAM FPGAs With Fault Injection | SHREC: NSF Center for Space, High-Performance & Resilient Computing

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Year

2021

Authors

A. Perez-Celis, C. Thurlow, M. Wirthlin

Conference/Journal Information

IEEE Transactions on Nuclear Science, Volume: 68 Issue: 8

Date

Apr. 7, 2021

DOI/Conference Number

10.1109/TNS.2021.3071704